| Saklaw ng wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 4nm, 1nm, 0,5nm opsyonal) |
| Katumpakan ng wavelength | : | ±0.3nm |
| Reproducibility ng wavelength | : | ≤0.15nm |
| Sistema ng Photometric | : | Double beam, auto scan, dual detector |
| Katumpakan ng Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Working Mode | : | T, A, C, E |
| Saklaw ng Photometric | : | -0.3-3.5A |
| Liwanag na Liwanag | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Katatagan | : | ≤0.001A/h (sa 500nm, pagkatapos mag-warm up) |
| ingay | : | ±0.001A (sa 500nm, pagkatapos ng warming up) |
| Pagpapakita | : | 6 na pulgada ang taas ng mapusyaw na asul na LCD |
| Detektor | : | Silicon photo-diode |
| kapangyarihan | : | AC 220V/50Hz, 110V/60Hz 180W |
| Mga sukat | : | 630×470×210mm |
| Timbang | : | 26kg |
| Saklaw ng wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 4nm, 1nm, 0,5nm opsyonal) |
| Katumpakan ng wavelength | : | ±0.3nm |
| Reproducibility ng wavelength | : | 0.15nm |
| Sistema ng Photometric | : | Pagsubaybay sa split-beam ratio, auto scan, dual detector |
| Katumpakan ng Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | 0.2%τ |
| Working Mode | : | T, A, C, E |
| Saklaw ng Photometric | : | -0.3-3A |
| Liwanag na Liwanag | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Katatagan | : | ≤0.001A/30min (sa 500nm, pagkatapos mag-warm up) |
| ingay | : | ±0.001A (sa 500nm, pagkatapos ng warming up) |
| Pagpapakita | : | 6 na pulgada ang taas ng mapusyaw na asul na LCD |
| Detektor | : | Silicon photo-diode |
| kapangyarihan | : | AC 220V/50Hz, 110V/60Hz 180W |
| Mga sukat | : | 630×470×210mm |
| Timbang | : | 26kg |
| Saklaw ng wavelength | : | 190-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 1nm, opsyonal) |
| Katumpakan ng wavelength | : | ±0.3nm |
| Reproducibility ng wavelength | : | 0.2nm |
| Sistema ng Photometric | : | Single beam, plane grating na 1200L/mm |
| Katumpakan ng Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Working Mode | : | T, A(-0.3-3A), C, E |
| Saklaw ng Photometric | : | -0.3-3A |
| Liwanag na Liwanag | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Katatagan | : | ≤0.001A/30min (sa 500nm, pagkatapos mag-warm up) |
| ingay | : | ±0.001A (sa 500nm, pagkatapos ng warming up) |
| Pagpapakita | : | 6 na pulgada ang taas ng mapusyaw na asul na LCD |
| Detektor | : | Silicon photo-diode |
| kapangyarihan | : | AC 220V/50Hz, 110V/60Hz 140W |
| Mga sukat | : | 530×410×210mm |
| Timbang | : | 18kg |
| Saklaw ng wavelength | : | 320-1100nm |
| Spectral Bandwidth | : | 2nm (5nm, 1nm, opsyonal) |
| Katumpakan ng wavelength | : | ±0.5nm |
| Reproducibility ng wavelength | : | 0.2nm |
| Sistema ng Photometric | : | Single beam, plane grating na 1200L/mm |
| Katumpakan ng Photometric | : | ±0.3τ (0~100τ) ± 0.002A (0~0.5A) ±0.004A (0.5~1A) |
| Photometric Reproducibility | : | ≤0.15%τ |
| Working Mode | : | T, A, C, E |
| Saklaw ng Photometric | : | -0.3-3A |
| Liwanag na Liwanag | : | ≤0.05%τ (Nal, 220nm, NaNO2 360nm) |
| Baseline Flatness | : | ±0.002A |
| Katatagan | : | ≤0.001A/30min (sa 500nm, pagkatapos mag-warm up) |
| Pinagmulan ng Banayad | : | Tungsten halogen lamp |
| Pagpapakita | : | 6 na pulgada ang taas ng mapusyaw na asul na LCD |
| Detektor | : | Silicon photo-diode |
| kapangyarihan | : | AC 220V/50Hz, 110V/60Hz 140W |
| Mga sukat | : | 530×410×210mm |
| Timbang | : | 18kg |